Super-resolution on-chip tomography of ferroelectric domains
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| Project ID: | GA19-22000S | | Provider: | Czech Science Foundation | | Period: | Jan 01, 2019 - Dec 31, 2021 | | Principal Investigator: | prof. doc. Pavel Mokrý, Ing. Ph.D. |
Aims of the project: The project is focused on the basic research of optical methods for three-dimensional imaging of microscopic structures in transparent materials. Examples of such structures are domains in ferroelectric materials, strain fields around topological defects in photoelastic materials, phase interfaces in solid-solid phase change materials, and so on. Developed methods will be based on super-resolution on-chip tomography, thus allowing three-dimensional imaging on the scale of hundreds of nanometers in the entire volume of the material under investigation. Super-resolution optical methods implemented with on-chip technology represent new tools applicable in ferroelectric physics, photoelastic analysis, and other fields of material research. |
Results: | Mach M., Stašík M., Kaván F., Mokrý P., Lédl V., Psota P.: Subaperture stitching digital holographic microscopy for precise wear volume measurement in tribology. Applied Optics 62 [8] (2023) 2137-2144. [ Abstract ] [ Link ] |
Mach M., Psota P., Žídek K., Mokrý P.: On-chip digital holographic interferometry for measuring wavefront deformation in transparent samples. Optics Express 31 [11] (2023) 17185-17200. [ Abstract ] [ Link ] |
Das N., Kanclíř V., Mokrý P., Žídek K.: Bulk and interface second harmonic generation in the Si3N4 thin films deposited via ion beam sputtering. Journal of Optics 23 [2] (2021) č. článku 024003. [ Abstract ] [ Link ] |
Stašík M., Kaván F., Mach M., Sedláčková K., Kredba J., Špína M.: Advanced Measurement Procedure for Interferometric Microscope for Three-dimensional Imaging of Complex Surfaces Using Two-wavelength Interferometry and Reference Arm Attenuation. Sensors & Transducers Journal 247 [8] (2020) 8-17. [ Abstract ] |
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